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Determination of porosity of thin protective films on iron base materials and modelling of their development during aqueous corrosion

Lee, Y.-Y. ; Enders, B. ; Ensinger, W. (2004)
Determination of porosity of thin protective films on iron base materials and modelling of their development during aqueous corrosion.
In: Thin Solid Films, 459 (1-2)
doi: 10.1016/j.tsf.2003.12.098
Artikel, Bibliographie

Kurzbeschreibung (Abstract)

Corrosion properties of thin protective films on corroding substrates are dependent on the electrochemical properties of the substrate materials, the intrinsic corrosion properties of thin protective films and also on the films porosity. Therefore knowledge about the porosity is required in order to be able to control and optimise the deposition process. In this contribution a recently developed method to measure the porosity by means of an electrochemical technique is applied. As a model system thin iron films were deposited on silicon wafers and coated with amorphous carbon as a protective layer. The depositions were done by vacuum evaporation and ion assisted sputter deposition. Raman measurements, scanning electron microscopy, atomic force microscopy and electrochemical polarisation measurements were carried out to characterize the films. A model based on geometrical considerations is used to describe the development of the pores during corrosion. The measurement results show that the model is able to extract data on the pores.

Typ des Eintrags: Artikel
Erschienen: 2004
Autor(en): Lee, Y.-Y. ; Enders, B. ; Ensinger, W.
Art des Eintrags: Bibliographie
Titel: Determination of porosity of thin protective films on iron base materials and modelling of their development during aqueous corrosion
Sprache: Englisch
Publikationsjahr: 1 Juli 2004
Verlag: Elsevier
Titel der Zeitschrift, Zeitung oder Schriftenreihe: Thin Solid Films
Jahrgang/Volume einer Zeitschrift: 459
(Heft-)Nummer: 1-2
DOI: 10.1016/j.tsf.2003.12.098
Kurzbeschreibung (Abstract):

Corrosion properties of thin protective films on corroding substrates are dependent on the electrochemical properties of the substrate materials, the intrinsic corrosion properties of thin protective films and also on the films porosity. Therefore knowledge about the porosity is required in order to be able to control and optimise the deposition process. In this contribution a recently developed method to measure the porosity by means of an electrochemical technique is applied. As a model system thin iron films were deposited on silicon wafers and coated with amorphous carbon as a protective layer. The depositions were done by vacuum evaporation and ion assisted sputter deposition. Raman measurements, scanning electron microscopy, atomic force microscopy and electrochemical polarisation measurements were carried out to characterize the films. A model based on geometrical considerations is used to describe the development of the pores during corrosion. The measurement results show that the model is able to extract data on the pores.

Freie Schlagworte: Ion assisted sputter deposition, Corrosion protection, Corrosion modelling, Carbon thin films
Fachbereich(e)/-gebiet(e): 11 Fachbereich Material- und Geowissenschaften
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Materialanalytik
Hinterlegungsdatum: 06 Sep 2012 07:55
Letzte Änderung: 30 Aug 2018 12:46
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