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Determination of porosity of thin protective films on iron base materials and modelling of their development during aqueous corrosion

Lee, Y.-Y. and Enders, B. and Ensinger, W. (2004):
Determination of porosity of thin protective films on iron base materials and modelling of their development during aqueous corrosion.
In: Thin Solid Films, Elsevier, pp. 237-240, 459, (1-2), ISSN 00406090,
[Online-Edition: http://dx.doi.org/10.1016/j.tsf.2003.12.098],
[Article]

Abstract

Corrosion properties of thin protective films on corroding substrates are dependent on the electrochemical properties of the substrate materials, the intrinsic corrosion properties of thin protective films and also on the films porosity. Therefore knowledge about the porosity is required in order to be able to control and optimise the deposition process. In this contribution a recently developed method to measure the porosity by means of an electrochemical technique is applied. As a model system thin iron films were deposited on silicon wafers and coated with amorphous carbon as a protective layer. The depositions were done by vacuum evaporation and ion assisted sputter deposition. Raman measurements, scanning electron microscopy, atomic force microscopy and electrochemical polarisation measurements were carried out to characterize the films. A model based on geometrical considerations is used to describe the development of the pores during corrosion. The measurement results show that the model is able to extract data on the pores.

Item Type: Article
Erschienen: 2004
Creators: Lee, Y.-Y. and Enders, B. and Ensinger, W.
Title: Determination of porosity of thin protective films on iron base materials and modelling of their development during aqueous corrosion
Language: English
Abstract:

Corrosion properties of thin protective films on corroding substrates are dependent on the electrochemical properties of the substrate materials, the intrinsic corrosion properties of thin protective films and also on the films porosity. Therefore knowledge about the porosity is required in order to be able to control and optimise the deposition process. In this contribution a recently developed method to measure the porosity by means of an electrochemical technique is applied. As a model system thin iron films were deposited on silicon wafers and coated with amorphous carbon as a protective layer. The depositions were done by vacuum evaporation and ion assisted sputter deposition. Raman measurements, scanning electron microscopy, atomic force microscopy and electrochemical polarisation measurements were carried out to characterize the films. A model based on geometrical considerations is used to describe the development of the pores during corrosion. The measurement results show that the model is able to extract data on the pores.

Journal or Publication Title: Thin Solid Films
Volume: 459
Number: 1-2
Publisher: Elsevier
Uncontrolled Keywords: Ion assisted sputter deposition, Corrosion protection, Corrosion modelling, Carbon thin films
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Material Analytics
Date Deposited: 06 Sep 2012 07:55
Official URL: http://dx.doi.org/10.1016/j.tsf.2003.12.098
Identification Number: doi:10.1016/j.tsf.2003.12.098
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