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Epitaxial growth of Gd2-xCexCuO4 thin films

Krockenberger, Y. and Kurian, J. and Naitoh, M. and Alff, L. (2008):
Epitaxial growth of Gd2-xCexCuO4 thin films.
In: Journal of Physics: Conference Series, pp. 012041, 108, ISSN 1742-6596,
[Online-Edition: http://dx.doi.org/10.1088/1742-6596/108/1/012041],
[Article]

Abstract

We have grown (001)-oriented thin films of Gd2-xCexCuO4with cerium composition 0 < x < 0.2 by state-of-the-art reactive molecular beam epitaxy and characterized them by x-ray diffraction and transport measurements. A systematical change in the c-axis length upon cerium doping indicates that single-phase films were obtained for the whole doping range. Based on a log po2 - 1/T phase diagram in combination with reflection high energy electron diffraction (RHEED), phase stability has been determined in order to achieve optimized reduction conditions. Gd2-xCexCuO4 thin films even after controlled reductions treatment did not show superconductivity in the whole range of Ce concentration studied. However, the room temperature resistivity of optimally reduced Gd2-xCexCuO4 thin films shows a minimum at around xCe = 0.16. Our results on the growth and characterization of Gd2-xCexCuO4 thin films on (100) SrTiO3 substrates are described in detail.

Item Type: Article
Erschienen: 2008
Creators: Krockenberger, Y. and Kurian, J. and Naitoh, M. and Alff, L.
Title: Epitaxial growth of Gd2-xCexCuO4 thin films
Language: English
Abstract:

We have grown (001)-oriented thin films of Gd2-xCexCuO4with cerium composition 0 < x < 0.2 by state-of-the-art reactive molecular beam epitaxy and characterized them by x-ray diffraction and transport measurements. A systematical change in the c-axis length upon cerium doping indicates that single-phase films were obtained for the whole doping range. Based on a log po2 - 1/T phase diagram in combination with reflection high energy electron diffraction (RHEED), phase stability has been determined in order to achieve optimized reduction conditions. Gd2-xCexCuO4 thin films even after controlled reductions treatment did not show superconductivity in the whole range of Ce concentration studied. However, the room temperature resistivity of optimally reduced Gd2-xCexCuO4 thin films shows a minimum at around xCe = 0.16. Our results on the growth and characterization of Gd2-xCexCuO4 thin films on (100) SrTiO3 substrates are described in detail.

Journal or Publication Title: Journal of Physics: Conference Series
Volume: 108
Divisions: 11 Department of Materials and Earth Sciences > Material Science > Advanced Thin Film Technology
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences
Date Deposited: 29 Mar 2012 11:19
Official URL: http://dx.doi.org/10.1088/1742-6596/108/1/012041
Identification Number: doi:10.1088/1742-6596/108/1/012041
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