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Extraction of Capacitive Profiles with a Planar Metamaterial Sensor

Puentes, M. and Schuessler, M. and Damm, C. and Jakoby, Rolf (2011):
Extraction of Capacitive Profiles with a Planar Metamaterial Sensor.
In: Applied Physics A, 103 (3), pp. 1-5, [Article]

Abstract

The extraction of capacitive profiles with a planar metamaterial sensor is presented. The sensor is build up using a tailored Composite right/left-handed transmission line (CRLH-TL). The capacitance values along the line can be evaluated by measuring the broadband line input impedance followed by applying a dedicated extraction method based on classical network synthesis with a combination of the Cauer canonical forms (CCF) I and II to obtain the values of the corresponding lumped elements in the equivalent circuit. Two prototype sensors have been developed and tested to prove the concept. The areas of application of these types of sensors are transportation of materials in industrial processes where the position of the Material Under Test (MUT) is of interest and can be derived from the changes in the capacitances.

Item Type: Article
Erschienen: 2011
Creators: Puentes, M. and Schuessler, M. and Damm, C. and Jakoby, Rolf
Title: Extraction of Capacitive Profiles with a Planar Metamaterial Sensor
Language: English
Abstract:

The extraction of capacitive profiles with a planar metamaterial sensor is presented. The sensor is build up using a tailored Composite right/left-handed transmission line (CRLH-TL). The capacitance values along the line can be evaluated by measuring the broadband line input impedance followed by applying a dedicated extraction method based on classical network synthesis with a combination of the Cauer canonical forms (CCF) I and II to obtain the values of the corresponding lumped elements in the equivalent circuit. Two prototype sensors have been developed and tested to prove the concept. The areas of application of these types of sensors are transportation of materials in industrial processes where the position of the Material Under Test (MUT) is of interest and can be derived from the changes in the capacitances.

Journal or Publication Title: Applied Physics A
Volume: 103
Number: 3
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics > Microwave Engineering
18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics
Date Deposited: 27 Jan 2012 15:20
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