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Characterization of Acoustic Effects in Ferroelectric Thin-Films for Microwave Components

Giere, A. ; Schafranek, R. ; Zheng, Y. ; Maune, H. ; Sazegar, M. ; Jakoby, Rolf ; Klein, Andreas (2008)
Characterization of Acoustic Effects in Ferroelectric Thin-Films for Microwave Components.
In: Frequenz, 62 (3-4)
doi: 10.1515/FREQ.2008.62.3-4.52
Artikel, Bibliographie

Kurzbeschreibung (Abstract)

In this paper we present the impact of acoustic resonances excited by electrostriction in BST thin-films on the Q-factor of a varactor in the GHz range. By changing the process-parameter substrate to target distance while sputtering the thin-films, we observe a change in the acoustic resonance frequencies. To characterize the material properties which determine the acoustic resonance frequencies a model based on a 1D acoustic transmission line is used. The extracted material properties results in a proportional dependency to the changed process parameter. For verification of the acoustic transmission line model 3D simulations have been performed which show good agreement to the line model for lower resonance frequencies, where the difference at higher frequencies becomes significant due to additional higher order modes.

Typ des Eintrags: Artikel
Erschienen: 2008
Autor(en): Giere, A. ; Schafranek, R. ; Zheng, Y. ; Maune, H. ; Sazegar, M. ; Jakoby, Rolf ; Klein, Andreas
Art des Eintrags: Bibliographie
Titel: Characterization of Acoustic Effects in Ferroelectric Thin-Films for Microwave Components
Sprache: Englisch
Publikationsjahr: April 2008
Titel der Zeitschrift, Zeitung oder Schriftenreihe: Frequenz
Jahrgang/Volume einer Zeitschrift: 62
(Heft-)Nummer: 3-4
DOI: 10.1515/FREQ.2008.62.3-4.52
Kurzbeschreibung (Abstract):

In this paper we present the impact of acoustic resonances excited by electrostriction in BST thin-films on the Q-factor of a varactor in the GHz range. By changing the process-parameter substrate to target distance while sputtering the thin-films, we observe a change in the acoustic resonance frequencies. To characterize the material properties which determine the acoustic resonance frequencies a model based on a 1D acoustic transmission line is used. The extracted material properties results in a proportional dependency to the changed process parameter. For verification of the acoustic transmission line model 3D simulations have been performed which show good agreement to the line model for lower resonance frequencies, where the difference at higher frequencies becomes significant due to additional higher order modes.

Freie Schlagworte: Acoustic effects, modeling, thin-film, ferroelectric, characterization barium strontium titanate
Fachbereich(e)/-gebiet(e): 11 Fachbereich Material- und Geowissenschaften
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Oberflächenforschung
18 Fachbereich Elektrotechnik und Informationstechnik
18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Mikrowellentechnik und Photonik (IMP) > Mikrowellentechnik
18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Mikrowellentechnik und Photonik (IMP)
Hinterlegungsdatum: 27 Jan 2012 15:19
Letzte Änderung: 07 Dez 2020 19:07
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