Dieringer, Rolf and Becker, Wilfried
:
Numerical Analysis of Crack Initiation at Stress Concentrations in Printed Transistors.
Proceedings of LOPE-C 2010, International Conference and Exhibition for the Organic and Printed Electronic Industry, 31.05.-02.06.2010, Frankfurt/M, CD-ROM.
[Conference or Workshop Item]
, (2010)
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 2010 |
| Creators: | Dieringer, Rolf and Becker, Wilfried |
| Title: | Numerical Analysis of Crack Initiation at Stress Concentrations in Printed Transistors. |
| Language: | English |
| Title of Book: | Proceedings of LOPE-C 2010, International Conference and Exhibition for the Organic and Printed Electronic Industry, 31.05.-02.06.2010, Frankfurt/M, CD-ROM. |
| Divisions: | 16 Department of Mechanical Engineering > Institute of Structural Mechanics (FSM) 16 Department of Mechanical Engineering |
| Date Deposited: | 27 Aug 2011 09:03 |
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