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Numerical Analysis of Crack Initiation at Stress Concentrations in Printed Transistors.

Dieringer, Rolf and Becker, Wilfried (2010):
Numerical Analysis of Crack Initiation at Stress Concentrations in Printed Transistors.
In: Proceedings of LOPE-C 2010, International Conference and Exhibition for the Organic and Printed Electronic Industry, 31.05.-02.06.2010, Frankfurt/M, CD-ROM., [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2010
Creators: Dieringer, Rolf and Becker, Wilfried
Title: Numerical Analysis of Crack Initiation at Stress Concentrations in Printed Transistors.
Language: English
Title of Book: Proceedings of LOPE-C 2010, International Conference and Exhibition for the Organic and Printed Electronic Industry, 31.05.-02.06.2010, Frankfurt/M, CD-ROM.
Divisions: 16 Department of Mechanical Engineering > Institute of Structural Mechanics (FSM)
16 Department of Mechanical Engineering
Date Deposited: 27 Aug 2011 09:03
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