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Efficient Reduction of Model-Based Generated Test Suites Through Test Case Pair Prioritization

Cichos, Harald and Heinze, Thomas :
Efficient Reduction of Model-Based Generated Test Suites Through Test Case Pair Prioritization.
[Online-Edition: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772249...]
In: Proceedings of the 7th International Workshop on Model-Driven Engineering, Verification and Validation (MoDeVVa 2010). In: IEEE Computer Society Press . IEEE Computer Society Press
[Conference or Workshop Item] , (2011)

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Official URL: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772249...
Item Type: Conference or Workshop Item
Erschienen: 2011
Creators: Cichos, Harald and Heinze, Thomas
Title: Efficient Reduction of Model-Based Generated Test Suites Through Test Case Pair Prioritization
Language: English
Series Name: IEEE Computer Society Press
Publisher: IEEE Computer Society Press
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute of Computer Engineering > Real-Time Systems
18 Department of Electrical Engineering and Information Technology > Institute of Computer Engineering
Department of Computer Science
Event Title: Proceedings of the 7th International Workshop on Model-Driven Engineering, Verification and Validation (MoDeVVa 2010)
Date Deposited: 22 Aug 2011 08:46
Official URL: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772249...
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