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Sessile-drop-induced bending of atomic force microscope cantilevers: a model system for monitoring microdrop evaporation

Haschke, Thomas and Bonaccurso, Elmar and Butt, Hans-Jürgen and Lautenschlager, Daniel and Schönfeld, Friedhelm and Wiechert, Wolfgang (2006):
Sessile-drop-induced bending of atomic force microscope cantilevers: a model system for monitoring microdrop evaporation.
In: Journal of Micromechanics and Microengineering, p. 2273, 16, (11), ISSN 0960-1317,
[Online-Edition: http://dx.doi.org/10.1088/0960-1317/16/11/004],
[Article]

Item Type: Article
Erschienen: 2006
Creators: Haschke, Thomas and Bonaccurso, Elmar and Butt, Hans-Jürgen and Lautenschlager, Daniel and Schönfeld, Friedhelm and Wiechert, Wolfgang
Title: Sessile-drop-induced bending of atomic force microscope cantilevers: a model system for monitoring microdrop evaporation
Language: English
Journal or Publication Title: Journal of Micromechanics and Microengineering
Volume: 16
Number: 11
Divisions: Zentrale Einrichtungen
UNSPECIFIED
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Date Deposited: 18 Aug 2011 15:04
Official URL: http://dx.doi.org/10.1088/0960-1317/16/11/004
Identification Number: doi:10.1088/0960-1317/16/11/004
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