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Evolution of bias field and offset piezoelectric coefficient in bulk lead zirconate titanate with fatigue

Zhang, Yong ; Baturin, Ivan S. ; Aulbach, Emil ; Lupascu, Doru C. ; Kholkin, Andrei L. ; Shur, Vladimir Ya. ; Rödel, Jürgen :
Evolution of bias field and offset piezoelectric coefficient in bulk lead zirconate titanate with fatigue.
[Online-Edition: http://dx.doi.org/10.1063/1.1847712]
In: Applied Physics Letters, 86 (1) 012910-1. ISSN 00036951
[Artikel], (2005)
Note:

SFB 595 Cooperation B5, D1

Offizielle URL: http://dx.doi.org/10.1063/1.1847712

Kurzbeschreibung (Abstract)

Hysteresis loops of the piezoelectric coefficient, d33 = f(E3), are measured on virgin and fatigued lead zirconate titanate ceramics. Four parameters are directly extracted from the measurements: internal bias field Eb, offset piezoelectric coefficient doffset, coercive field Ec, and remnant piezoelectric coefficient dr. The reduction in dr displays the decreasing switchable polarization with fatigue cycling. Eb and doffset are found to be linearly related. After thermal annealing, both offsets disappear, while the increase in Ec and the reduction in dr withstand annealing. The microscopic entities responsible for the offsets are less stable than those for reduced switching.

Typ des Eintrags: Artikel
Erschienen: 2005
Autor(en): Zhang, Yong ; Baturin, Ivan S. ; Aulbach, Emil ; Lupascu, Doru C. ; Kholkin, Andrei L. ; Shur, Vladimir Ya. ; Rödel, Jürgen
Titel: Evolution of bias field and offset piezoelectric coefficient in bulk lead zirconate titanate with fatigue
Sprache: Englisch
Kurzbeschreibung (Abstract):

Hysteresis loops of the piezoelectric coefficient, d33 = f(E3), are measured on virgin and fatigued lead zirconate titanate ceramics. Four parameters are directly extracted from the measurements: internal bias field Eb, offset piezoelectric coefficient doffset, coercive field Ec, and remnant piezoelectric coefficient dr. The reduction in dr displays the decreasing switchable polarization with fatigue cycling. Eb and doffset are found to be linearly related. After thermal annealing, both offsets disappear, while the increase in Ec and the reduction in dr withstand annealing. The microscopic entities responsible for the offsets are less stable than those for reduced switching.

Titel der Zeitschrift, Zeitung oder Schriftenreihe: Applied Physics Letters
Band: 86
(Heft-)Nummer: 1
Freie Schlagworte: lead compounds, ferroelectric ceramics, piezoceramics, piezoelectricity, dielectric hysteresis, dielectric polarisation, ferroelectric switching, annealing
Fachbereich(e)/-gebiet(e): Fachbereich Material- und Geowissenschaften > Materialwissenschaften > Nichtmetallisch-Anorganische Werkstoffe
Zentrale Einrichtungen
Zentrale Einrichtungen > Sonderforschungsbereich 595
Zentrale Einrichtungen > Sonderforschungsbereich 595 > B - Charakterisierung
Zentrale Einrichtungen > Sonderforschungsbereich 595 > B - Charakterisierung > B5
Zentrale Einrichtungen > Sonderforschungsbereich 595 > D - Bauteileigenschaften
Zentrale Einrichtungen > Sonderforschungsbereich 595 > D - Bauteileigenschaften > D1
Fachbereich Material- und Geowissenschaften > Materialwissenschaften
Fachbereich Material- und Geowissenschaften
Hinterlegungsdatum: 15 Aug 2011 11:46
Offizielle URL: http://dx.doi.org/10.1063/1.1847712
Zusätzliche Informationen:

SFB 595 Cooperation B5, D1

ID-Nummer: 10.1063/1.1847712
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