Evolution of bias field and offset piezoelectric coefficient in bulk lead zirconate titanate with fatigue

Zhang, Yong and Baturin, Ivan S. and Aulbach, Emil and Lupascu, Doru C. and Kholkin, Andrei L. and Shur, Vladimir Ya. and Rödel, Jürgen :
Evolution of bias field and offset piezoelectric coefficient in bulk lead zirconate titanate with fatigue.
[Online-Edition: http://dx.doi.org/10.1063/1.1847712]
In: Applied Physics Letters, 86 (1) 012910-1. ISSN 00036951
[Article] , (2005)
Note:
SFB 595 Cooperation B5, D1

Official URL: http://dx.doi.org/10.1063/1.1847712

Abstract

Hysteresis loops of the piezoelectric coefficient, d33 = f(E3), are measured on virgin and fatigued lead zirconate titanate ceramics. Four parameters are directly extracted from the measurements: internal bias field Eb, offset piezoelectric coefficient doffset, coercive field Ec, and remnant piezoelectric coefficient dr. The reduction in dr displays the decreasing switchable polarization with fatigue cycling. Eb and doffset are found to be linearly related. After thermal annealing, both offsets disappear, while the increase in Ec and the reduction in dr withstand annealing. The microscopic entities responsible for the offsets are less stable than those for reduced switching.

Item Type:	Article
Erschienen:	2005
Creators:	Zhang, Yong and Baturin, Ivan S. and Aulbach, Emil and Lupascu, Doru C. and Kholkin, Andrei L. and Shur, Vladimir Ya. and Rödel, Jürgen
Title:	Evolution of bias field and offset piezoelectric coefficient in bulk lead zirconate titanate with fatigue
Language:	English
Abstract:	Hysteresis loops of the piezoelectric coefficient, d33 = f(E3), are measured on virgin and fatigued lead zirconate titanate ceramics. Four parameters are directly extracted from the measurements: internal bias field Eb, offset piezoelectric coefficient doffset, coercive field Ec, and remnant piezoelectric coefficient dr. The reduction in dr displays the decreasing switchable polarization with fatigue cycling. Eb and doffset are found to be linearly related. After thermal annealing, both offsets disappear, while the increase in Ec and the reduction in dr withstand annealing. The microscopic entities responsible for the offsets are less stable than those for reduced switching.
Journal or Publication Title:	Applied Physics Letters
Volume:	86
Number:	1
Uncontrolled Keywords:	lead compounds, ferroelectric ceramics, piezoceramics, piezoelectricity, dielectric hysteresis, dielectric polarisation, ferroelectric switching, annealing
Divisions:	11 Department of Materials and Earth Sciences > Material Science > Nonmetallic-Inorganic Materials Zentrale Einrichtungen DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > B - Characterisation DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > B - Characterisation > Subproject B5: Model experiments about interactions between ferroelectric domains with point defects and their agglomerates DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > D - Component properties DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > D - Component properties > Subproject D1: Mesoscopic and macroscopic fatigue in doped ferroelectric ceramics 11 Department of Materials and Earth Sciences > Material Science 11 Department of Materials and Earth Sciences DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres DFG-Collaborative Research Centres (incl. Transregio)
Date Deposited:	15 Aug 2011 11:46
Official URL:	http://dx.doi.org/10.1063/1.1847712
Additional Information:	SFB 595 Cooperation B5, D1
Identification Number:	doi:10.1063/1.1847712
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