TU Darmstadt / ULB / TUbiblio

Interface Properties of Single and Bi-Layer Fe3O4 Films Grown on MgO(001) Studied by RBS and Channeling Experiments

Kim-Ngan, N.-T. H. and Balogh, A. G. and Brötz, J. and Zajac, M. and Korecki, J. :
Interface Properties of Single and Bi-Layer Fe3O4 Films Grown on MgO(001) Studied by RBS and Channeling Experiments.
In: Acta Physica Polonica A, 118 (4) pp. 570-575.
[Article] , (2010)

Abstract

Series of Fe3O4/MgO(001) and Fe3O4/Fe/MgO(001) films (single- and bi-layer films, respectively) with a total layer thickness in the range of 20¥150 nm were investigated by the Rutherford backscattering spectrometry (2 MeV He+ ion beam), by the Rutherford backscattering spectrometry channeling experiments (1.5 MeV He+ ion beam). Depending on the layer thickness of each layer and the film geometry, a single Fe peak and/or a double-anomaly feature was revealed in the Rutherford backscattering spectra. For all films no magnesium presence in the surface layer was observed. For both single- and bi-layer films with a total layer thickness less than 60 nm only one minimum was observed in the channeling curves, while a double minimum was revealed for the bi-layer films with a larger thickness. X-ray reflectometry measurements have revealed that the film density is the same as that of the bulk one.

Item Type: Article
Erschienen: 2010
Creators: Kim-Ngan, N.-T. H. and Balogh, A. G. and Brötz, J. and Zajac, M. and Korecki, J.
Title: Interface Properties of Single and Bi-Layer Fe3O4 Films Grown on MgO(001) Studied by RBS and Channeling Experiments
Language: English
Abstract:

Series of Fe3O4/MgO(001) and Fe3O4/Fe/MgO(001) films (single- and bi-layer films, respectively) with a total layer thickness in the range of 20¥150 nm were investigated by the Rutherford backscattering spectrometry (2 MeV He+ ion beam), by the Rutherford backscattering spectrometry channeling experiments (1.5 MeV He+ ion beam). Depending on the layer thickness of each layer and the film geometry, a single Fe peak and/or a double-anomaly feature was revealed in the Rutherford backscattering spectra. For all films no magnesium presence in the surface layer was observed. For both single- and bi-layer films with a total layer thickness less than 60 nm only one minimum was observed in the channeling curves, while a double minimum was revealed for the bi-layer films with a larger thickness. X-ray reflectometry measurements have revealed that the film density is the same as that of the bulk one.

Journal or Publication Title: Acta Physica Polonica A
Volume: 118
Number: 4
Divisions: 11 Department of Materials and Earth Sciences > Material Science > Material Analytics
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences
Date Deposited: 06 Dec 2010 12:47
Funders: The financial support from German Academic Exchange Service (DAAD)-project D/08/07729 (between Germany and Poland) is highly acknowledged., N.-T.H.K.-N. acknowledges the financial support by the Ministry of Science and Higher Education (MNiSW project No. 651N-DAAD/2010/0)., A.G.B. acknowledges the financial support by German Research Foundation (DFG; SFB-595 project)., This work was supported in part by the Team Program of the Foundation for Polish Science co-financed by the EU European Regional Development Fund.
Export:

Optionen (nur für Redakteure)

View Item View Item