Flohr, Th. ; Kolev, N. ; Pfeiffer, W. (1996)
Partial discharge measurement for the investigation of solid insulation ageing.
IEEE International Symposium on Electrical Insulation. Montreal, Canada (16.-19.06.1996)
doi: 10.1109/ELINSL.1996.549380
Konferenzveröffentlichung, Bibliographie
Kurzbeschreibung (Abstract)
The paper deals with the use of partial discharge (PD) measurements for the investigation of solid insulation ageing caused by voltage and temperature stress. Different insulating materials such as insulating foils, insulated wires, insulating tapes and flexible insulating sleeving used in manufacturing of electrical machines were tested. Partial discharge data collected during a certain recording time have been accumulated. Comparisons between degradation caused by voltage stress, degradation caused by thermal stress and degradation due to both factors are given and discussed.
| Typ des Eintrags: | Konferenzveröffentlichung |
|---|---|
| Erschienen: | 1996 |
| Autor(en): | Flohr, Th. ; Kolev, N. ; Pfeiffer, W. |
| Art des Eintrags: | Bibliographie |
| Titel: | Partial discharge measurement for the investigation of solid insulation ageing |
| Sprache: | Englisch |
| Publikationsjahr: | 1996 |
| Verlag: | IEEE |
| Buchtitel: | Conference Recolrd of the 1996 IEEE International Syniposium on Electrical Insulation |
| Veranstaltungstitel: | IEEE International Symposium on Electrical Insulation |
| Veranstaltungsort: | Montreal, Canada |
| Veranstaltungsdatum: | 16.-19.06.1996 |
| DOI: | 10.1109/ELINSL.1996.549380 |
| Zugehörige Links: | |
| Kurzbeschreibung (Abstract): | The paper deals with the use of partial discharge (PD) measurements for the investigation of solid insulation ageing caused by voltage and temperature stress. Different insulating materials such as insulating foils, insulated wires, insulating tapes and flexible insulating sleeving used in manufacturing of electrical machines were tested. Partial discharge data collected during a certain recording time have been accumulated. Comparisons between degradation caused by voltage stress, degradation caused by thermal stress and degradation due to both factors are given and discussed. |
| Fachbereich(e)/-gebiet(e): | 18 Fachbereich Elektrotechnik und Informationstechnik 18 Fachbereich Elektrotechnik und Informationstechnik > Elektrische Messtechnik 18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Elektrische Energiesysteme > Hochspannungstechnik 18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Elektrische Energiesysteme |
| Hinterlegungsdatum: | 19 Nov 2008 15:59 |
| Letzte Änderung: | 05 Apr 2023 12:36 |
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