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Methodology for the structural characterisation of VxOy species supported on silica under reaction conditions by means of in situ O K-edge X-ray absorption spectroscopy

Hävecker, Michael and Cavalleri, Matteo and Herbert, Rita and Follath, Rolf and Knop-Gericke, Axel and Hess, Christian and Hermann, Klaus and Schlögl, Robert (2009):
Methodology for the structural characterisation of VxOy species supported on silica under reaction conditions by means of in situ O K-edge X-ray absorption spectroscopy.
246, In: Physica Status Solidi (b), (7), p. 1459, ISSN 03701972, [Online-Edition: http://dx.doi.org/10.1002/pssb.200945067],
[Article]

Item Type: Article
Erschienen: 2009
Creators: Hävecker, Michael and Cavalleri, Matteo and Herbert, Rita and Follath, Rolf and Knop-Gericke, Axel and Hess, Christian and Hermann, Klaus and Schlögl, Robert
Title: Methodology for the structural characterisation of VxOy species supported on silica under reaction conditions by means of in situ O K-edge X-ray absorption spectroscopy
Language: English
Journal or Publication Title: Physica Status Solidi (b)
Volume: 246
Number: 7
Divisions: 07 Department of Chemistry
07 Department of Chemistry > Physical Chemistry
Date Deposited: 28 Oct 2010 13:50
Official URL: http://dx.doi.org/10.1002/pssb.200945067
Identification Number: doi:10.1002/pssb.200945067
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