TU Darmstadt / ULB / TUbiblio

Measurement and modelling of sensitivity and noise of MOS magnetic field effect transistors

Killat, Dirk (1996):
Measurement and modelling of sensitivity and noise of MOS magnetic field effect transistors.
In: Proceedings of Eurosensors X, the 10th European Conference on Solid-State Transducers, Sept. 1996, Leuven, Belgium. S. 1261-1262, Heverlee, Belgium: Catholic Univ. Leuven, 1996,
Heverlee, Belgium, Catholic Univ. Leuven, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 1996
Creators: Killat, Dirk
Title: Measurement and modelling of sensitivity and noise of MOS magnetic field effect transistors
Language: English
Series Name: Proceedings of Eurosensors X, the 10th European Conference on Solid-State Transducers, Sept. 1996, Leuven, Belgium. S. 1261-1262
Place of Publication: Heverlee, Belgium
Publisher: Catholic Univ. Leuven
Edition: Heverlee, Belgium: Catholic Univ. Leuven, 1996
Divisions: 18 Department of Electrical Engineering and Information Technology
Date Deposited: 19 Nov 2008 15:59
License: [undefiniert]
Export:
Suche nach Titel in: TUfind oder in Google
Send an inquiry Send an inquiry

Options (only for editors)

View Item View Item