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Structure of thin block copolymer films studied by X-ray reflectivity

Mutter, R. and Strobl, G. and Stühn, B. (1993):
Structure of thin block copolymer films studied by X-ray reflectivity.
In: Fresenius Journal of Analytical Chemistry, 346 (1-3), pp. 297-299. [Article]

Abstract

X-ray reflectivity may be used to determine the internal structure of thin polymer films. An electron density difference of 10% for polystyrene and polyisoprene is sufficient to distinguish between a random distribution of lamellae, complete orientation parallel to the substrate surface and a surface induced formation of lamellae. The disappearance of the lamellar Bragg-peaks, with heating of the film, shows the transition into the disordered state.

Item Type: Article
Erschienen: 1993
Creators: Mutter, R. and Strobl, G. and Stühn, B.
Title: Structure of thin block copolymer films studied by X-ray reflectivity
Language: English
Abstract:

X-ray reflectivity may be used to determine the internal structure of thin polymer films. An electron density difference of 10% for polystyrene and polyisoprene is sufficient to distinguish between a random distribution of lamellae, complete orientation parallel to the substrate surface and a surface induced formation of lamellae. The disappearance of the lamellar Bragg-peaks, with heating of the film, shows the transition into the disordered state.

Journal or Publication Title: Fresenius Journal of Analytical Chemistry
Journal volume: 346
Number: 1-3
Divisions: 05 Department of Physics
05 Department of Physics > Institute for condensed matter physics
Date Deposited: 26 Feb 2010 13:52
Additional Information:

7TH WORKING CONF ON APPLIED SURFACE ANALYSIS, JULICH, GERMANY, JUN 22-25, 1992

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