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Diameter dependent failure current density of gold nanowires

Karim, Shafqat ; Maaz, K. ; Ali, G. ; Ensinger, Wolfgang :
Diameter dependent failure current density of gold nanowires.
[Online-Edition: http://www.iop.org/EJ/abstract/0022-3727/42/18/185403/]
In: Journal of Physics D: Applied Physics, 42 (18) p. 185403.
[Artikel], (2009)

Offizielle URL: http://www.iop.org/EJ/abstract/0022-3727/42/18/185403/

Kurzbeschreibung (Abstract)

Failure current density of single gold nanowires is investigated in this paper. Single wires with diameters ranging from 80 to 720 nm and length 30μm were electrochemically deposited in ion track-etched single-pore polycarbonate membranes. The maximum current density was investigated while keeping the wires embedded in the polymer matrix and ramping up the current until failure occurred. The current density is found to increase with diminishing diameter and the wires with a diameter of 80 nm withstand 1.2 × 1012Am−2 before undergoing failure. Possible reasons for these results are discussed in this paper.

Typ des Eintrags: Artikel
Erschienen: 2009
Autor(en): Karim, Shafqat ; Maaz, K. ; Ali, G. ; Ensinger, Wolfgang
Titel: Diameter dependent failure current density of gold nanowires
Sprache: Englisch
Kurzbeschreibung (Abstract):

Failure current density of single gold nanowires is investigated in this paper. Single wires with diameters ranging from 80 to 720 nm and length 30μm were electrochemically deposited in ion track-etched single-pore polycarbonate membranes. The maximum current density was investigated while keeping the wires embedded in the polymer matrix and ramping up the current until failure occurred. The current density is found to increase with diminishing diameter and the wires with a diameter of 80 nm withstand 1.2 × 1012Am−2 before undergoing failure. Possible reasons for these results are discussed in this paper.

Titel der Zeitschrift, Zeitung oder Schriftenreihe: Journal of Physics D: Applied Physics
Band: 42
(Heft-)Nummer: 18
Verlag: IOP Publishing
Freie Schlagworte: Surfaces, interfaces and thin films; Nanoscale science and low-D systems
Fachbereich(e)/-gebiet(e): Fachbereich Material- und Geowissenschaften > Materialwissenschaften > Materialanalytik
Fachbereich Material- und Geowissenschaften > Materialwissenschaften
Fachbereich Material- und Geowissenschaften
Hinterlegungsdatum: 23 Sep 2009 13:51
Offizielle URL: http://www.iop.org/EJ/abstract/0022-3727/42/18/185403/
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