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Single charged-particle damage to living cells: a new method based on track-etch detectors.

Durante, Marco and Grossi, G. F. and Pugliese, M. and Manti, L. and Nappo, M. and Gialanella, G. (1994):
Single charged-particle damage to living cells: a new method based on track-etch detectors.
In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, (3), 94. Elsevier Science Publishing, pp. 251-258, ISSN 0168-583X,
DOI: 10.1016/0168-583X(94)95363-5,
[Article]

Item Type: Article
Erschienen: 1994
Creators: Durante, Marco and Grossi, G. F. and Pugliese, M. and Manti, L. and Nappo, M. and Gialanella, G.
Title: Single charged-particle damage to living cells: a new method based on track-etch detectors.
Language: English
Journal or Publication Title: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Number: 3
Publisher: Elsevier Science Publishing
Divisions: 05 Department of Physics
Date Deposited: 28 Jan 2009 14:31
DOI: 10.1016/0168-583X(94)95363-5
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