Schwalke, Udo (2007):
Structural and Electrical Characterization of Dielectrics, Carbon Nanotubes and Nanoelectronic Devices by Means of Scanning Probe Microscopy.
In: ECS Transactions, 10 (1), pp. 129-140. [Article]
Official URL: http://dx.doi.org/10.1149/1.2773983
Item Type: | Article |
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Erschienen: | 2007 |
Creators: | Schwalke, Udo |
Title: | Structural and Electrical Characterization of Dielectrics, Carbon Nanotubes and Nanoelectronic Devices by Means of Scanning Probe Microscopy |
Language: | English |
Journal or Publication Title: | ECS Transactions |
Journal volume: | 10 |
Number: | 1 |
Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
Event Title: | The Electrochemical Society Symposium "Analytical Techniques for Semiconductor Materials and Process Characterization" (ECS-ALTECH) |
Event Location: | München, Deutschland |
Event Dates: | 13.-14.09.2007 |
Date Deposited: | 20 Nov 2008 08:28 |
Official URL: | http://dx.doi.org/10.1149/1.2773983 |
License: | [undefiniert] |
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