Schwalke, Udo (2007):
Structural and Electrical Characterization of Dielectrics, Carbon Nanotubes and Nanoelectronic Devices by Means of Scanning Probe Microscopy.
In: ECS Transactions, pp. 129-140, 10, (1), [Online-Edition: http://dx.doi.org/10.1149/1.2773983],
[Article]
Official URL: http://dx.doi.org/10.1149/1.2773983
| Item Type: | Article |
|---|---|
| Erschienen: | 2007 |
| Creators: | Schwalke, Udo |
| Title: | Structural and Electrical Characterization of Dielectrics, Carbon Nanotubes and Nanoelectronic Devices by Means of Scanning Probe Microscopy |
| Language: | English |
| Journal or Publication Title: | ECS Transactions |
| Volume: | 10 |
| Number: | 1 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
| Event Title: | The Electrochemical Society Symposium "Analytical Techniques for Semiconductor Materials and Process Characterization" (ECS-ALTECH) |
| Event Location: | München, Deutschland |
| Event Dates: | 13.-14.09.2007 |
| Date Deposited: | 20 Nov 2008 08:28 |
| Official URL: | http://dx.doi.org/10.1149/1.2773983 |
| License: | [undefiniert] |
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