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Structural and Electrical Characterization of Dielectrics, Carbon Nanotubes and Nanoelectronic Devices by Means of Scanning Probe Microscopy

Schwalke, Udo (2007):
Structural and Electrical Characterization of Dielectrics, Carbon Nanotubes and Nanoelectronic Devices by Means of Scanning Probe Microscopy.
In: ECS Transactions, pp. 129-140, 10, (1), [Online-Edition: http://dx.doi.org/10.1149/1.2773983],
[Article]

Item Type: Article
Erschienen: 2007
Creators: Schwalke, Udo
Title: Structural and Electrical Characterization of Dielectrics, Carbon Nanotubes and Nanoelectronic Devices by Means of Scanning Probe Microscopy
Language: English
Journal or Publication Title: ECS Transactions
Volume: 10
Number: 1
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics
Event Title: The Electrochemical Society Symposium "Analytical Techniques for Semiconductor Materials and Process Characterization" (ECS-ALTECH)
Event Location: München, Deutschland
Event Dates: 13.-14.09.2007
Date Deposited: 20 Nov 2008 08:28
Official URL: http://dx.doi.org/10.1149/1.2773983
License: [undefiniert]
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