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Self consistent analytical solution of a problem of charge-carrier injection at a conductor/ insulator interface

Neumann, Frederik ; Genenko, Yuri A. ; Melzer, Christian ; Yampolskii, Sergey V. ; Seggern, Heinz von (2007)
Self consistent analytical solution of a problem of charge-carrier injection at a conductor/ insulator interface.
In: Physical Review B, 75
Artikel, Bibliographie

Kurzbeschreibung (Abstract)

We present a closed description of the charge-carrier injection process from a conductor into an insulator. Common injection models are based on single electron descriptions, being problematic especially once the amount of charge-carriers injected is large. Accordingly, we developed a model, which incorporates space-charge effects in the description of the injection process. The challenge of this task is the problem of self-consistency. The amount of charge carriers injected per unit time strongly depends on the energy barrier emerging at the contact, while at the same time the electrostatic potential generated by the injected charge carriers modifies the height of this injection barrier itself. In our model, self-consistency is obtained by assuming continuity of the electric displacement and the electrochemical potential all over the conductor/insulator system. The conductor and the insulator are properly taken into account by means of their respective density of state distributions. The electric-field distributions are obtained in a closed analytical form and the resulting current-voltage characteristics show that the theory embraces injection-limited as well as bulk-limited charge-carrier transports. Analytical approximations of these limits are given, revealing physical mechanisms responsible for the particular current-voltage behavior. In addition, the model exhibits the crossover between the two limiting cases and determines the validity of respective approximations. The consequences resulting from our exactly solvable model are discussed on the basis of a simplified indium tin oxide/organic semiconductor system.

Typ des Eintrags: Artikel
Erschienen: 2007
Autor(en): Neumann, Frederik ; Genenko, Yuri A. ; Melzer, Christian ; Yampolskii, Sergey V. ; Seggern, Heinz von
Art des Eintrags: Bibliographie
Titel: Self consistent analytical solution of a problem of charge-carrier injection at a conductor/ insulator interface
Sprache: Englisch
Publikationsjahr: 1 Mai 2007
Titel der Zeitschrift, Zeitung oder Schriftenreihe: Physical Review B
Jahrgang/Volume einer Zeitschrift: 75
Kurzbeschreibung (Abstract):

We present a closed description of the charge-carrier injection process from a conductor into an insulator. Common injection models are based on single electron descriptions, being problematic especially once the amount of charge-carriers injected is large. Accordingly, we developed a model, which incorporates space-charge effects in the description of the injection process. The challenge of this task is the problem of self-consistency. The amount of charge carriers injected per unit time strongly depends on the energy barrier emerging at the contact, while at the same time the electrostatic potential generated by the injected charge carriers modifies the height of this injection barrier itself. In our model, self-consistency is obtained by assuming continuity of the electric displacement and the electrochemical potential all over the conductor/insulator system. The conductor and the insulator are properly taken into account by means of their respective density of state distributions. The electric-field distributions are obtained in a closed analytical form and the resulting current-voltage characteristics show that the theory embraces injection-limited as well as bulk-limited charge-carrier transports. Analytical approximations of these limits are given, revealing physical mechanisms responsible for the particular current-voltage behavior. In addition, the model exhibits the crossover between the two limiting cases and determines the validity of respective approximations. The consequences resulting from our exactly solvable model are discussed on the basis of a simplified indium tin oxide/organic semiconductor system.

Zusätzliche Informationen:

SFB 595 Cooperation C5, D4

Fachbereich(e)/-gebiet(e): 11 Fachbereich Material- und Geowissenschaften
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft
DFG-Sonderforschungsbereiche (inkl. Transregio)
DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche
Zentrale Einrichtungen
DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung
DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung > C - Modellierung
DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung > C - Modellierung > Teilprojekt C5: Phänomenologische Modellierung von Injektion, Transport und Rekombination in Bauelementen aus organischen Halbleitern sowie aus nichtorganischen Ferroelektrika
DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung > D - Bauteileigenschaften
DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung > D - Bauteileigenschaften > Teilprojekt D4: Betriebsbedingte Ermüdung von Bauelementen aus organischen Halbleitern
Hinterlegungsdatum: 20 Nov 2008 08:26
Letzte Änderung: 20 Feb 2020 13:23
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