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Electrical Characterisation of Crystalline Praseodymium Oxide High-K Gate Dielectric MOSFETs

Schwalke, Udo and Stefanov, Yordan and Komaragiri, Rama Subrahmanyam and Ruland, Tino (2003):
Electrical Characterisation of Crystalline Praseodymium Oxide High-K Gate Dielectric MOSFETs.
In: Proceedings of the 33rd European Solid State Device Research Conference (ESSDERC), pp. 243-246, [Online-Edition: http://dx.doi.org/10.1109/ESSDERC.2003.1256859],
[Article]

Item Type: Article
Erschienen: 2003
Creators: Schwalke, Udo and Stefanov, Yordan and Komaragiri, Rama Subrahmanyam and Ruland, Tino
Title: Electrical Characterisation of Crystalline Praseodymium Oxide High-K Gate Dielectric MOSFETs
Language: English
Journal or Publication Title: Proceedings of the 33rd European Solid State Device Research Conference (ESSDERC)
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics
Event Title: European Solid-State Device Research Conference (ESSDERC)
Event Location: Estoril, Portugal
Event Dates: 16.-18.09.2003
Date Deposited: 20 Nov 2008 08:24
Official URL: http://dx.doi.org/10.1109/ESSDERC.2003.1256859
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