Schwalke, Udo and Stefanov, Yordan and Komaragiri, Rama Subrahmanyam and Ruland, Tino (2003):
Electrical Characterisation of Crystalline Praseodymium Oxide High-K Gate Dielectric MOSFETs.
In: Proceedings of the 33rd European Solid State Device Research Conference (ESSDERC), pp. 243-246. [Article]
Official URL: http://dx.doi.org/10.1109/ESSDERC.2003.1256859
| Item Type: | Article |
|---|---|
| Erschienen: | 2003 |
| Creators: | Schwalke, Udo and Stefanov, Yordan and Komaragiri, Rama Subrahmanyam and Ruland, Tino |
| Title: | Electrical Characterisation of Crystalline Praseodymium Oxide High-K Gate Dielectric MOSFETs |
| Language: | English |
| Journal or Publication Title: | Proceedings of the 33rd European Solid State Device Research Conference (ESSDERC) |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
| Event Title: | European Solid-State Device Research Conference (ESSDERC) |
| Event Location: | Estoril, Portugal |
| Event Dates: | 16.-18.09.2003 |
| Date Deposited: | 20 Nov 2008 08:24 |
| Official URL: | http://dx.doi.org/10.1109/ESSDERC.2003.1256859 |
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