Komaragiri, Rama Subrahmanyam and Schwalke, Udo and Stefanov, Yordan and Ruland, Tino (2003):
Comparison of Praseodymium Oxide Gate MOSFETs with Conventional SiO2 MOSFETs: A Simulation Study.
In: Proceedings of the International Workshop on Physics of Semiconductor Devices (IWPSD), [Article]
Item Type: | Article |
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Erschienen: | 2003 |
Creators: | Komaragiri, Rama Subrahmanyam and Schwalke, Udo and Stefanov, Yordan and Ruland, Tino |
Title: | Comparison of Praseodymium Oxide Gate MOSFETs with Conventional SiO2 MOSFETs: A Simulation Study |
Language: | English |
Journal or Publication Title: | Proceedings of the International Workshop on Physics of Semiconductor Devices (IWPSD) |
Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
Event Title: | International Workshop on Physics of Semiconductor Devices (IWPSD) |
Event Location: | Madras, Indien |
Date Deposited: | 20 Nov 2008 08:24 |
License: | [undefiniert] |
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Suche nach Titel in: | TUfind oder in Google |
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