Komaragiri, Rama Subrahmanyam and Schwalke, Udo and Stefanov, Yordan and Ruland, Tino (2003):
Comparison of Praseodymium Oxide Gate MOSFETs with Conventional SiO2 MOSFETs: A Simulation Study.
In: Proceedings of the International Workshop on Physics of Semiconductor Devices (IWPSD), [Article]
| Item Type: | Article |
|---|---|
| Erschienen: | 2003 |
| Creators: | Komaragiri, Rama Subrahmanyam and Schwalke, Udo and Stefanov, Yordan and Ruland, Tino |
| Title: | Comparison of Praseodymium Oxide Gate MOSFETs with Conventional SiO2 MOSFETs: A Simulation Study |
| Language: | English |
| Journal or Publication Title: | Proceedings of the International Workshop on Physics of Semiconductor Devices (IWPSD) |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
| Event Title: | International Workshop on Physics of Semiconductor Devices (IWPSD) |
| Event Location: | Madras, Indien |
| Date Deposited: | 20 Nov 2008 08:24 |
| License: | [undefiniert] |
| Export: | |
| Suche nach Titel in: | TUfind oder in Google |
Optionen (nur für Redakteure)
 |
View Item |
Drucken
Impressum