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A general stability analysis of FIT/FDTD applied to lossy dielectrics and lumped elements

Edelvik, F. and Schuhmann, Rolf and Weiland, Thomas (2004):
A general stability analysis of FIT/FDTD applied to lossy dielectrics and lumped elements.
In: International Journal of numerical modelling, 17 (4), pp. 407-419. Wiley-Blackwell-STM, e-ISSN 1099-1204,
DOI: 10.1002/jnm.547,
[Article]

Item Type: Article
Erschienen: 2004
Creators: Edelvik, F. and Schuhmann, Rolf and Weiland, Thomas
Title: A general stability analysis of FIT/FDTD applied to lossy dielectrics and lumped elements
Language: English
Journal or Publication Title: International Journal of numerical modelling
Journal volume: 17
Number: 4
Publisher: Wiley-Blackwell-STM
Divisions: 18 Department of Electrical Engineering and Information Technology
Date Deposited: 20 Nov 2008 08:20
DOI: 10.1002/jnm.547
License: [undefiniert]
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