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On the assessment of cracks within the interface of thin layers on a substrate

Mueller, A. and Goswami, S. and Hohe, J. and Becker, Wilfried (2004):
On the assessment of cracks within the interface of thin layers on a substrate.
In: PAMM - Proceedings in Applied Mathematics and Mechanics, 4, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2004
Creators: Mueller, A. and Goswami, S. and Hohe, J. and Becker, Wilfried
Title: On the assessment of cracks within the interface of thin layers on a substrate
Language: English
Series Name: PAMM - Proceedings in Applied Mathematics and Mechanics
Volume: 4
Divisions: Study Areas > Study Area Mechanic
16 Department of Mechanical Engineering > Institute of Structural Mechanics (FSM)
16 Department of Mechanical Engineering
Study Areas
Date Deposited: 20 Nov 2008 08:19
License: [undefiniert]
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