Schmechel, Roland ; Seggern, Heinz von (2004)
Electronic traps in organic transport layers.
In: physica status solidi (a), 201 (6)
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
The knowledge about properties of electronic traps in organic semiconductors is one of the major keys for the understanding and optimization of charge transport in organic devices. In the present article the density of occupied states of the most prominent pristine small molecule systems and selected polymers are reported determined, by fractional thermally stimulated current and luminescence techniques. In order to distinguish between impurity and structurally based traps, model systems of doped as well as differently deposited layers were studied. In addition, the influence of detected traps on steady state I–V and dynamic time-of-flight characteristics are reported.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2004 |
| Autor(en): | Schmechel, Roland ; Seggern, Heinz von |
| Art des Eintrags: | Bibliographie |
| Titel: | Electronic traps in organic transport layers |
| Sprache: | Englisch |
| Publikationsjahr: | Mai 2004 |
| Verlag: | WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | physica status solidi (a) |
| Jahrgang/Volume einer Zeitschrift: | 201 |
| (Heft-)Nummer: | 6 |
| Kurzbeschreibung (Abstract): | The knowledge about properties of electronic traps in organic semiconductors is one of the major keys for the understanding and optimization of charge transport in organic devices. In the present article the density of occupied states of the most prominent pristine small molecule systems and selected polymers are reported determined, by fractional thermally stimulated current and luminescence techniques. In order to distinguish between impurity and structurally based traps, model systems of doped as well as differently deposited layers were studied. In addition, the influence of detected traps on steady state I–V and dynamic time-of-flight characteristics are reported. |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Elektronische Materialeigenschaften |
| Hinterlegungsdatum: | 20 Nov 2008 08:19 |
| Letzte Änderung: | 20 Feb 2020 13:25 |
| PPN: | |
| Sponsoren: | The authors like to express their gratitude to financial support by the BMBF and DFG (Project No: KA 1207/5). |
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