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Low frequency noise-based monitoring of the effects of RF and DC stress on AlGaN/GaN MODFETs

Valizadeh, P. and Pavlidis, Dimitris (2003):
Low frequency noise-based monitoring of the effects of RF and DC stress on AlGaN/GaN MODFETs.
In: GaAs IC Symposium <25, 2003, San Diego, Calif.>: Technical digest 2003 ...- Piscataway, NJ: IEEE Service Center, 2003.- 304 S.- ISBN 0-7803-7833-4.- S. 78-81, Piscataway, NJ, IEEE Service Center, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2003
Creators: Valizadeh, P. and Pavlidis, Dimitris
Title: Low frequency noise-based monitoring of the effects of RF and DC stress on AlGaN/GaN MODFETs
Language: English
Series Name: GaAs IC Symposium <25, 2003, San Diego, Calif.>: Technical digest 2003 ...- Piscataway, NJ: IEEE Service Center, 2003.- 304 S.- ISBN 0-7803-7833-4.- S. 78-81
Place of Publication: Piscataway, NJ
Publisher: IEEE Service Center
Divisions: 18 Department of Electrical Engineering and Information Technology
Date Deposited: 20 Nov 2008 08:18
License: [undefiniert]
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