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Optical characterization of AlN/GaN heterostructure

Ursaki, V. V. and Tiginyanu, I. M. and Zalamai, V. V. and Hubbard, S. M. and Pavlidis, Dimitris (2003):
Optical characterization of AlN/GaN heterostructure.
In: Journal of Applied Physics, (8), 94. American Institute of Physics, pp. 4813-4818, ISSN 00218979,
DOI: 10.1063/1.1609048,
[Article]

Item Type: Article
Erschienen: 2003
Creators: Ursaki, V. V. and Tiginyanu, I. M. and Zalamai, V. V. and Hubbard, S. M. and Pavlidis, Dimitris
Title: Optical characterization of AlN/GaN heterostructure
Language: English
Journal or Publication Title: Journal of Applied Physics
Journal volume: 94
Number: 8
Publisher: American Institute of Physics
Divisions: 18 Department of Electrical Engineering and Information Technology
Date Deposited: 20 Nov 2008 08:18
DOI: 10.1063/1.1609048
License: [undefiniert]
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