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Analysis of prebreakdown and breakdown of SF/sub 6//N/sub 2/ mixtures in non-uniform gaps for very fast transient voltages

Pfeiffer, Wolfgang ; Schoen, D. ; Zender, C. (1998)
Analysis of prebreakdown and breakdown of SF/sub 6//N/sub 2/ mixtures in non-uniform gaps for very fast transient voltages.
1998 IEEE International Symposium on Electrical Insulation. Arlington, USA (07.-10.06.1998)
doi: 10.1109/ELINSL.1998.694886
Konferenzveröffentlichung, Bibliographie

Kurzbeschreibung (Abstract)

This paper deals with prebreakdown- and breakdown phenomena in SF/sub 6//N/sub 2/ gas mixtures, stressed with very fast transient (VFT) voltages. The investigations were performed for positive voltage, frequencies from 3 to 12 MHz, admixtures of N/sub 2/ to SF/sub 6/ from 0% to 100% and a pressure range from 0.1 to 0.8 MPa. Gaps with uniform and non-uniform field distribution were investigated.

Typ des Eintrags: Konferenzveröffentlichung
Erschienen: 1998
Autor(en): Pfeiffer, Wolfgang ; Schoen, D. ; Zender, C.
Art des Eintrags: Bibliographie
Titel: Analysis of prebreakdown and breakdown of SF/sub 6//N/sub 2/ mixtures in non-uniform gaps for very fast transient voltages
Sprache: Englisch
Publikationsjahr: 11 Juni 1998
Verlag: IEEE
Buchtitel: Conference record of the 1998 IEEE International Symposium on Electrical Insulation
Veranstaltungstitel: 1998 IEEE International Symposium on Electrical Insulation
Veranstaltungsort: Arlington, USA
Veranstaltungsdatum: 07.-10.06.1998
DOI: 10.1109/ELINSL.1998.694886
Kurzbeschreibung (Abstract):

This paper deals with prebreakdown- and breakdown phenomena in SF/sub 6//N/sub 2/ gas mixtures, stressed with very fast transient (VFT) voltages. The investigations were performed for positive voltage, frequencies from 3 to 12 MHz, admixtures of N/sub 2/ to SF/sub 6/ from 0% to 100% and a pressure range from 0.1 to 0.8 MPa. Gaps with uniform and non-uniform field distribution were investigated.

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Fachbereich(e)/-gebiet(e): 18 Fachbereich Elektrotechnik und Informationstechnik
18 Fachbereich Elektrotechnik und Informationstechnik > Elektrische Messtechnik
Hinterlegungsdatum: 19 Nov 2008 15:54
Letzte Änderung: 01 Jun 2023 12:48
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