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Advanced electromagnetic field analysis for high quality beams

Weiland, Thomas ; Schuhmann, R. (2001):
Advanced electromagnetic field analysis for high quality beams.
In: ISEM 2001: International Symposium on Applied Electromagnetics and Mechanics <10, 2001, Tokyo>; Proceedings. S. 303-304, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2001
Creators: Weiland, Thomas ; Schuhmann, R.
Title: Advanced electromagnetic field analysis for high quality beams
Language: English
Series Name: ISEM 2001: International Symposium on Applied Electromagnetics and Mechanics <10, 2001, Tokyo>; Proceedings. S. 303-304
Divisions: 18 Department of Electrical Engineering and Information Technology
Date Deposited: 19 Nov 2008 16:28
License: [undefiniert]
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