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Aline-scanning theodolite-based system for 3D applications in close range

Hovenbitzer, M. ; Schlemmer, (1997):
Aline-scanning theodolite-based system for 3D applications in close range.
In: Optical 3D measurement techniques <4, 1997>: Proceedings. - Heidelberg: Wichmann, 1997, Heidelberg, Wichmann, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 1997
Creators: Hovenbitzer, M. ; Schlemmer,
Title: Aline-scanning theodolite-based system for 3D applications in close range
Language: English
Series Name: Optical 3D measurement techniques <4, 1997>: Proceedings. - Heidelberg: Wichmann, 1997
Place of Publication: Heidelberg
Publisher: Wichmann
Divisions: ?? fb12-EX ??
Date Deposited: 19 Nov 2008 16:27
License: [undefiniert]
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