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Phase quantification of ß-Si3N4/ß-SiC mixtures by X-ray powder diffraction analysis

Nicolich, Jeffrey P. ; Lences, Z. ; Dreßler, W. ; Riedel, Ralf (2000):
Phase quantification of ß-Si3N4/ß-SiC mixtures by X-ray powder diffraction analysis.
In: Journal of Materials Science, 35(6), pp. 1427-1432, KLUWER ACADEMIC PUBL, Netherlands, Joint Meeting of the 45th Annual Denver X-Ray Conference / Powder Diffraction Satellite Meeting of the XVIIth Congress of the International-Union-of-Crystallography, Denver, Colorado, AUG 08, 1996, DOI: 10.1023/A:1004727401914,
[Conference or Workshop Item]

Abstract

X-ray powder diffraction methods of phase quantification were adapted and compared to mixtures of -Si3N4 and -SiC. Multiline mean-normalized-intensity methods and whole pattern analysis (Rietveld) both have advantages and disadvantages over each other. Satisfactory results (less than 3% absolute deviation) can be achieved in minimal time using intensity normalization methods. Phase quantification using the Rietveld method requires significantly longer measuring time, evaluation time and expertise to obtain the same results.

Item Type: Conference or Workshop Item
Erschienen: 2000
Creators: Nicolich, Jeffrey P. ; Lences, Z. ; Dreßler, W. ; Riedel, Ralf
Title: Phase quantification of ß-Si3N4/ß-SiC mixtures by X-ray powder diffraction analysis
Language: English
Abstract:

X-ray powder diffraction methods of phase quantification were adapted and compared to mixtures of -Si3N4 and -SiC. Multiline mean-normalized-intensity methods and whole pattern analysis (Rietveld) both have advantages and disadvantages over each other. Satisfactory results (less than 3% absolute deviation) can be achieved in minimal time using intensity normalization methods. Phase quantification using the Rietveld method requires significantly longer measuring time, evaluation time and expertise to obtain the same results.

Journal or Publication Title: Journal of materials science
Series Name: Journal of Materials Science
Volume: 35(6)
Number: 6
Publisher: KLUWER ACADEMIC PUBL, Netherlands
Uncontrolled Keywords: Ceramics
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Dispersive Solids
Event Title: Joint Meeting of the 45th Annual Denver X-Ray Conference / Powder Diffraction Satellite Meeting of the XVIIth Congress of the International-Union-of-Crystallography
Event Location: Denver, Colorado
Event Dates: AUG 08, 1996
Date Deposited: 19 Nov 2008 16:27
DOI: 10.1023/A:1004727401914
Funders: Financial support by the federal ministry of education and research, Bonn, project number WTZ SLAX262.11 and the Fonds der Chemischen Industrie, Frankfurt, is gratefully acknowledged.
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