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Total-reflection X-ray fluorescence analysis of geological microsamples

Ebert, Martin ; Mair, V. ; Tessadri, R. ; Hoffmann, P. ; Ortner, H. M. (2000)
Total-reflection X-ray fluorescence analysis of geological microsamples.
In: Spectrochimica Acta Part B: Atomic Spectroscopy, 55 (3)
doi: 10.1016/S0584-8547(99)00178-0
Artikel, Bibliographie

Kurzbeschreibung (Abstract)

The major and minor components of single inclusion-free crystals with diameters of approximately 1 mm of a naturally occurring garnet were quantitatively determined by use of electron microprobe analysis (EMPA) with EDX- and WDX-spectrometry. In order to check the EMPA-results single garnet crystals were separated mechanically, decomposed chemically and the sample solutions were investigated by total-reflection X-ray fluorescence analysis (TXRF). Results obtained by TXRF as well as by EMPA of the major and minor components are in good agreement. The accuracy and precision of the applied methods were checked by an additional investigation of certified corundum and basaltic reference materials. The results of this preliminary work show that the combination of a suitable decomposition technique followed by TXRF measurement is an accurate tool for the chemical characterisation of mineralogical and geological microsamples.

Typ des Eintrags: Artikel
Erschienen: 2000
Autor(en): Ebert, Martin ; Mair, V. ; Tessadri, R. ; Hoffmann, P. ; Ortner, H. M.
Art des Eintrags: Bibliographie
Titel: Total-reflection X-ray fluorescence analysis of geological microsamples
Sprache: Englisch
Publikationsjahr: März 2000
Verlag: Elsevier
Titel der Zeitschrift, Zeitung oder Schriftenreihe: Spectrochimica Acta Part B: Atomic Spectroscopy
Jahrgang/Volume einer Zeitschrift: 55
(Heft-)Nummer: 3
DOI: 10.1016/S0584-8547(99)00178-0
URL / URN: http://www.sciencedirect.com/science/article/B6THN-3YXB2KN-1...
Kurzbeschreibung (Abstract):

The major and minor components of single inclusion-free crystals with diameters of approximately 1 mm of a naturally occurring garnet were quantitatively determined by use of electron microprobe analysis (EMPA) with EDX- and WDX-spectrometry. In order to check the EMPA-results single garnet crystals were separated mechanically, decomposed chemically and the sample solutions were investigated by total-reflection X-ray fluorescence analysis (TXRF). Results obtained by TXRF as well as by EMPA of the major and minor components are in good agreement. The accuracy and precision of the applied methods were checked by an additional investigation of certified corundum and basaltic reference materials. The results of this preliminary work show that the combination of a suitable decomposition technique followed by TXRF measurement is an accurate tool for the chemical characterisation of mineralogical and geological microsamples.

Fachbereich(e)/-gebiet(e): 11 Fachbereich Material- und Geowissenschaften
11 Fachbereich Material- und Geowissenschaften > Geowissenschaften
11 Fachbereich Material- und Geowissenschaften > Geowissenschaften > Fachgebiet Umweltmineralogie
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Materialanalytik
Hinterlegungsdatum: 19 Nov 2008 16:24
Letzte Änderung: 26 Apr 2021 14:26
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