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Total-reflection X-ray fluorescence analysis of geological microsamples

Ebert, Martin and Mair, V. and Tessadri, R. and Hoffmann, P. and Ortner, H. M. (2000):
Total-reflection X-ray fluorescence analysis of geological microsamples.
In: Spectrochimica Acta Part B: Atomic Spectroscopy, pp. 205-212, 55, (3), [Online-Edition: http://www.sciencedirect.com/science/article/B6THN-3YXB2KN-1...],
[Article]

Abstract

The major and minor components of single inclusion-free crystals with diameters of approximately 1 mm of a naturally occurring garnet were quantitatively determined by use of electron microprobe analysis (EMPA) with EDX- and WDX-spectrometry. In order to check the EMPA-results single garnet crystals were separated mechanically, decomposed chemically and the sample solutions were investigated by total-reflection X-ray fluorescence analysis (TXRF). Results obtained by TXRF as well as by EMPA of the major and minor components are in good agreement. The accuracy and precision of the applied methods were checked by an additional investigation of certified corundum and basaltic reference materials. The results of this preliminary work show that the combination of a suitable decomposition technique followed by TXRF measurement is an accurate tool for the chemical characterisation of mineralogical and geological microsamples.

Item Type: Article
Erschienen: 2000
Creators: Ebert, Martin and Mair, V. and Tessadri, R. and Hoffmann, P. and Ortner, H. M.
Title: Total-reflection X-ray fluorescence analysis of geological microsamples
Language: English
Abstract:

The major and minor components of single inclusion-free crystals with diameters of approximately 1 mm of a naturally occurring garnet were quantitatively determined by use of electron microprobe analysis (EMPA) with EDX- and WDX-spectrometry. In order to check the EMPA-results single garnet crystals were separated mechanically, decomposed chemically and the sample solutions were investigated by total-reflection X-ray fluorescence analysis (TXRF). Results obtained by TXRF as well as by EMPA of the major and minor components are in good agreement. The accuracy and precision of the applied methods were checked by an additional investigation of certified corundum and basaltic reference materials. The results of this preliminary work show that the combination of a suitable decomposition technique followed by TXRF measurement is an accurate tool for the chemical characterisation of mineralogical and geological microsamples.

Journal or Publication Title: Spectrochimica Acta Part B: Atomic Spectroscopy
Volume: 55
Number: 3
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Earth Science
11 Department of Materials and Earth Sciences > Earth Science > Environmental Mineralogy
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Material Analytics
Date Deposited: 19 Nov 2008 16:24
Official URL: http://www.sciencedirect.com/science/article/B6THN-3YXB2KN-1...
License: [undefiniert]
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