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Applications of image analysis for the quantitative characterisation of microstructural defects in materials

Exner, Hans Eckart ; Rettenmayr, M. (1997):
Applications of image analysis for the quantitative characterisation of microstructural defects in materials.
In: DRIP VII: International Conference on Defect Recognition and Image Processing in Semiconductors <7, 1997, Templin>: Proceedings, Hrsg.: J. Donecker (u.a.) - Bristol (u.a.): Inst. of Physics Publ., 1998, 160, Bristol (u.a.), Institute of Physics Publishing, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 1997
Creators: Exner, Hans Eckart ; Rettenmayr, M.
Title: Applications of image analysis for the quantitative characterisation of microstructural defects in materials
Language: English
Series Name: DRIP VII: International Conference on Defect Recognition and Image Processing in Semiconductors <7, 1997, Templin>: Proceedings, Hrsg.: J. Donecker (u.a.) - Bristol (u.a.): Inst. of Physics Publ., 1998
Volume: 160
Place of Publication: Bristol (u.a.)
Publisher: Institute of Physics Publishing
Divisions: 11 Department of Materials and Earth Sciences > Department of Earth Sciences (1999 merged into Department of Materials and Earth Sciences)
11 Department of Materials and Earth Sciences
Date Deposited: 19 Nov 2008 16:23
License: [undefiniert]
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