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AFM and STM characterisation of porous gallium phosphide

Ichizli, Victoria M. (1998):
AFM and STM characterisation of porous gallium phosphide.
In: WOCSDICE´98: Workshop on Compound Semiconductor Devices and Integrated Circuits <22, 1998, Zeuthen>: Proceedings. S. 39-40, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 1998
Creators: Ichizli, Victoria M.
Title: AFM and STM characterisation of porous gallium phosphide
Language: English
Series Name: WOCSDICE´98: Workshop on Compound Semiconductor Devices and Integrated Circuits <22, 1998, Zeuthen>: Proceedings. S. 39-40
Divisions: 18 Department of Electrical Engineering and Information Technology
Date Deposited: 19 Nov 2008 16:22
License: [undefiniert]
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