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3D Simulation of Point Defect Migration in Ferroelectrics

Goy, Oliver ; Müller, Ralf ; Gross, Dietmar (2006)
3D Simulation of Point Defect Migration in Ferroelectrics.
In: PAMM — Proceedings in Applied Mathematics and Mechanics, 6 (1)
doi: 10.1002/pamm.200610200
Artikel, Bibliographie

Kurzbeschreibung (Abstract)

Electric fatigue in functional materials involves a set of phenomena which lead to the degradation of materials with an increasing number of electrical cycles. Ionic and electronic charge carriers, later 0 as point defects, interact with each other and with microstructural elements in the bulk and with interfaces, which can lead to degradation, or finally to mechanical damage and dissociation reactions, see e.g. 1. With this in mind, efforts are made to calculate the fields caused by point defects to simulate their interaction as well as to verify the used material parameters. Here, a material with linear electro mechanical coupling is used. The applied methods are integral transforms (Radon Transform) and a combination of Difference Methods and a Fast Fourier Transform to obtain solutions in an infinite domain and under periodic boundary conditions, respectively. The point defect interaction is studied within the framework of material or configurational forces. These forces are used in combination with reasonable kinetic laws to simulate defect migration, cf. 2. (© 2006 WILEY-VCH Verlag GmbH \& Co. KGaA, Weinheim)

Typ des Eintrags: Artikel
Erschienen: 2006
Autor(en): Goy, Oliver ; Müller, Ralf ; Gross, Dietmar
Art des Eintrags: Bibliographie
Titel: 3D Simulation of Point Defect Migration in Ferroelectrics
Sprache: Englisch
Publikationsjahr: 2006
Verlag: Wiley
Titel der Zeitschrift, Zeitung oder Schriftenreihe: PAMM — Proceedings in Applied Mathematics and Mechanics
Jahrgang/Volume einer Zeitschrift: 6
(Heft-)Nummer: 1
DOI: 10.1002/pamm.200610200
URL / URN: https://onlinelibrary.wiley.com/doi/abs/10.1002/pamm.2006102...
Kurzbeschreibung (Abstract):

Electric fatigue in functional materials involves a set of phenomena which lead to the degradation of materials with an increasing number of electrical cycles. Ionic and electronic charge carriers, later 0 as point defects, interact with each other and with microstructural elements in the bulk and with interfaces, which can lead to degradation, or finally to mechanical damage and dissociation reactions, see e.g. 1. With this in mind, efforts are made to calculate the fields caused by point defects to simulate their interaction as well as to verify the used material parameters. Here, a material with linear electro mechanical coupling is used. The applied methods are integral transforms (Radon Transform) and a combination of Difference Methods and a Fast Fourier Transform to obtain solutions in an infinite domain and under periodic boundary conditions, respectively. The point defect interaction is studied within the framework of material or configurational forces. These forces are used in combination with reasonable kinetic laws to simulate defect migration, cf. 2. (© 2006 WILEY-VCH Verlag GmbH \& Co. KGaA, Weinheim)

Fachbereich(e)/-gebiet(e): 13 Fachbereich Bau- und Umweltingenieurwissenschaften
13 Fachbereich Bau- und Umweltingenieurwissenschaften > Fachgebiete der Mechanik
13 Fachbereich Bau- und Umweltingenieurwissenschaften > Fachgebiete der Mechanik > Fachgebiet Kontinuumsmechanik
Hinterlegungsdatum: 03 Mai 2022 07:13
Letzte Änderung: 03 Mai 2022 07:13
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