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Application of transmission line pulses for reliability characterisation of high temperature devices

Krozer, Viktor and Brandt, and Schüßler, and Hartnagel, (1998):
Application of transmission line pulses for reliability characterisation of high temperature devices.
In: HiTEC´98: High -Temperature Electronics Conference <1998, Albuquerque>: Proceedings. S. 138-143, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 1998
Creators: Krozer, Viktor and Brandt, and Schüßler, and Hartnagel,
Title: Application of transmission line pulses for reliability characterisation of high temperature devices
Language: English
Series Name: HiTEC´98: High -Temperature Electronics Conference <1998, Albuquerque>: Proceedings. S. 138-143
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:22
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