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Simulation of predischarge processes in SF6/N2 mixtures stressed by very fast transient voltages

Pfeiffer, Wolfgang and Schoen, D. and Tong, L. (1999):
Simulation of predischarge processes in SF6/N2 mixtures stressed by very fast transient voltages.
In: Conference on Electrical Insulation and Dielectric Phenomena <68, 1999, Austin, Texas>: Annual report. S. 391-394. - New York, NY: IEEE, 1999, New York, NY, IEEE, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 1999
Creators: Pfeiffer, Wolfgang and Schoen, D. and Tong, L.
Title: Simulation of predischarge processes in SF6/N2 mixtures stressed by very fast transient voltages
Language: English
Series Name: Conference on Electrical Insulation and Dielectric Phenomena <68, 1999, Austin, Texas>: Annual report. S. 391-394. - New York, NY: IEEE, 1999
Place of Publication: New York, NY
Publisher: IEEE
Divisions: 18 Department of Electrical Engineering and Information Technology
Date Deposited: 19 Nov 2008 16:22
License: [undefiniert]
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