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Reliable GaN-Based THz Gunn Diodes With Side-Contact and Field-Plate Technologies

Hajo, A. S. and Yilmazoglu, O. and Dadgar, A. and Küppers, F. and Kusserow, T. (2020):
Reliable GaN-Based THz Gunn Diodes With Side-Contact and Field-Plate Technologies.
In: IEEE Access, 8, pp. 84116-84122. e-ISSN 21693536,
DOI: 10.1109/ACCESS.2020.2991309,
[Article]

Item Type: Article
Erschienen: 2020
Creators: Hajo, A. S. and Yilmazoglu, O. and Dadgar, A. and Küppers, F. and Kusserow, T.
Title: Reliable GaN-Based THz Gunn Diodes With Side-Contact and Field-Plate Technologies
Language: English
Journal or Publication Title: IEEE Access
Journal volume: 8
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics > Photonics and Optical Communications
18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics
18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics > Terahertz Systems Technology
Date Deposited: 18 Dec 2020 12:55
DOI: 10.1109/ACCESS.2020.2991309
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