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{001}-textured Pb(Zr, Ti)O3 thin films on stainless steel by pulsed laser deposition

Cardoletti, Juliette ; Komissinskiy, Philipp ; Bruder, Enrico ; Morandi, Carl ; Alff, Lambert (2020)
{001}-textured Pb(Zr, Ti)O3 thin films on stainless steel by pulsed laser deposition.
In: Journal of Applied Physics, 128 (10)
doi: 10.1063/5.0019967
Artikel, Bibliographie

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Kurzbeschreibung (Abstract)

In this work, we report nearly single oriented {001}-textured ferroelectric PbZr0:52Ti0:48O3 thin films grown by pulsed laser deposition onto AISI 304 stainless steel substrates. Pt, Al2O3, and LaNiO3 buffer layers promote the PbZr0:52Ti0:48O3 {001} texture and protect the substrate against oxidation during deposition. The dominant {001} texture of the PbZr0:52Ti0:48O3 layer was confirmed using x-ray and electron backscatter diffraction. Before poling, the films exhibit a permittivity of about 350 at 1 kHz and a dielectric loss below 5%. The films display a remanent polarization of about 16:5 mu Ccm(2) and a high coercive field of up to E-c 1/4 135:9 kVcm(-1). The properties of these PbZr0:52Ti0:48O3 thin films on stainless steel are promising for various MEMS applications such as transducers or energy harvesters.

Typ des Eintrags: Artikel
Erschienen: 2020
Autor(en): Cardoletti, Juliette ; Komissinskiy, Philipp ; Bruder, Enrico ; Morandi, Carl ; Alff, Lambert
Art des Eintrags: Bibliographie
Titel: {001}-textured Pb(Zr, Ti)O3 thin films on stainless steel by pulsed laser deposition
Sprache: Englisch
Publikationsjahr: 14 September 2020
Verlag: American Institute of Physics
Titel der Zeitschrift, Zeitung oder Schriftenreihe: Journal of Applied Physics
Jahrgang/Volume einer Zeitschrift: 128
(Heft-)Nummer: 10
DOI: 10.1063/5.0019967
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Kurzbeschreibung (Abstract):

In this work, we report nearly single oriented {001}-textured ferroelectric PbZr0:52Ti0:48O3 thin films grown by pulsed laser deposition onto AISI 304 stainless steel substrates. Pt, Al2O3, and LaNiO3 buffer layers promote the PbZr0:52Ti0:48O3 {001} texture and protect the substrate against oxidation during deposition. The dominant {001} texture of the PbZr0:52Ti0:48O3 layer was confirmed using x-ray and electron backscatter diffraction. Before poling, the films exhibit a permittivity of about 350 at 1 kHz and a dielectric loss below 5%. The films display a remanent polarization of about 16:5 mu Ccm(2) and a high coercive field of up to E-c 1/4 135:9 kVcm(-1). The properties of these PbZr0:52Ti0:48O3 thin films on stainless steel are promising for various MEMS applications such as transducers or energy harvesters.

Fachbereich(e)/-gebiet(e): 11 Fachbereich Material- und Geowissenschaften
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Dünne Schichten
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Physikalische Metallkunde
Hinterlegungsdatum: 20 Nov 2020 09:02
Letzte Änderung: 19 Mär 2024 07:20
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Projekte: This work was funded by the Deutsche Forschungsgemeinschaft (DFG) under Grant No. AL 560/19-1., A travel grant from the EIT RawMaterials IDS-FunMat-Inno is also acknowledged.
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