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Electrical and thermal conductivities of polycrystalline platinum nanowires

Wang, Jianli and Yu, Hongmei and Walbert, Torsten and Antoni, Markus and Wang, Cong and Xi, Wei and Muench, Falk and Yang, Juekuan and Chen, Yunfei and Ensinger, Wolfgang (2019):
Electrical and thermal conductivities of polycrystalline platinum nanowires.
In: Nanotechnology, 30 (45), p. 455706. Institute of Physics Publishing (IOP), ISSN 0957-4484, e-ISSN 1361-6528,
DOI: 10.1088/1361-6528/ab37a7,
[Article]

Abstract

Understanding the electrical and thermal transport properties of polycrystalline metallic nanostructures is of great interest for applications in microelectronics. In view of the diverse experimental results in polycrystalline metallic nanowires and nanofilms, it is a long-standing question whether their electrical and thermal properties can be well predicted by a practical model. By eliminating the effects of electrical and thermal contact resistances, we measure the electrical and thermal conductivities of three different polycrystalline Pt nanowires. The electron scattering at the surface is found to be diffusive, and the charge reflection coefficient at grain boundaries is proved to be a function of the melting point. The Lorenz number is observed to be suppressed from the free-electron value by about 30%, which can be explained by introducing a thermal reflection coefficient in calculating the thermal conductivity to account for the small angle scattering effect involving phonons at the grain boundaries. Using this model, both the electrical and thermal conductivities of the polycrystalline Pt nanowires are calculated at different diameters and temperatures.

Item Type: Article
Erschienen: 2019
Creators: Wang, Jianli and Yu, Hongmei and Walbert, Torsten and Antoni, Markus and Wang, Cong and Xi, Wei and Muench, Falk and Yang, Juekuan and Chen, Yunfei and Ensinger, Wolfgang
Title: Electrical and thermal conductivities of polycrystalline platinum nanowires
Language: English
Abstract:

Understanding the electrical and thermal transport properties of polycrystalline metallic nanostructures is of great interest for applications in microelectronics. In view of the diverse experimental results in polycrystalline metallic nanowires and nanofilms, it is a long-standing question whether their electrical and thermal properties can be well predicted by a practical model. By eliminating the effects of electrical and thermal contact resistances, we measure the electrical and thermal conductivities of three different polycrystalline Pt nanowires. The electron scattering at the surface is found to be diffusive, and the charge reflection coefficient at grain boundaries is proved to be a function of the melting point. The Lorenz number is observed to be suppressed from the free-electron value by about 30%, which can be explained by introducing a thermal reflection coefficient in calculating the thermal conductivity to account for the small angle scattering effect involving phonons at the grain boundaries. Using this model, both the electrical and thermal conductivities of the polycrystalline Pt nanowires are calculated at different diameters and temperatures.

Journal or Publication Title: Nanotechnology
Journal volume: 30
Number: 45
Publisher: Institute of Physics Publishing (IOP)
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Material Analytics
Date Deposited: 14 Feb 2020 10:10
DOI: 10.1088/1361-6528/ab37a7
Official URL: https://doi.org/10.1088/1361-6528/ab37a7
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