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Characterization of a Terahertz Isolator using a 1.5 Port Vector Spectrometer

Faridi, Fahd R. and Preu, Sascha (2019):
Characterization of a Terahertz Isolator using a 1.5 Port Vector Spectrometer.
In: 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Paris, France, 1-6 Sept. 2019, DOI: 10.1109/IRMMW-THz.2019.8873976,
[Online-Edition: https://doi.org/10.1109/IRMMW-THz.2019.8873976],
[Conference or Workshop Item]

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Item Type: Conference or Workshop Item
Erschienen: 2019
Creators: Faridi, Fahd R. and Preu, Sascha
Title: Characterization of a Terahertz Isolator using a 1.5 Port Vector Spectrometer
Language: English
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics
18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics > Terahertz Systems Technology
Event Title: 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)
Event Location: Paris, France
Event Dates: 1-6 Sept. 2019
Date Deposited: 25 Oct 2019 10:04
DOI: 10.1109/IRMMW-THz.2019.8873976
Official URL: https://doi.org/10.1109/IRMMW-THz.2019.8873976
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