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Reliability issues and length dependence of nanocrystalline graphene field-effect transistors for gas sensing

Noll, Dennis and Schwalke, Udo (2019):
Reliability issues and length dependence of nanocrystalline graphene field-effect transistors for gas sensing.
Mykonos, Greece, In: 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS), 16.-18. April 2019, DOI: 10.1109/DTIS.2019.8734953,
[Online-Edition: https://ieeexplore.ieee.org/abstract/document/8734953],
[Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2019
Creators: Noll, Dennis and Schwalke, Udo
Title: Reliability issues and length dependence of nanocrystalline graphene field-effect transistors for gas sensing
Language: English
Journal or Publication Title: 2019 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)
Place of Publication: Mykonos, Greece
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics
Event Title: 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)
Event Dates: 16.-18. April 2019
Date Deposited: 30 Jul 2019 09:23
DOI: 10.1109/DTIS.2019.8734953
Official URL: https://ieeexplore.ieee.org/abstract/document/8734953
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