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Reliability Improvement of High-Power THz GaN Gunn Sources for Active Imaging Systems

Hajo, A. S. and Yilmazoglu, O. and Küppers, F. and Dadgar, A. (2018):
Reliability Improvement of High-Power THz GaN Gunn Sources for Active Imaging Systems.
In: 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), ISSN 2162-2035,
DOI: 10.1109/IRMMW-THz.2018.8510363,
[Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2018
Creators: Hajo, A. S. and Yilmazoglu, O. and Küppers, F. and Dadgar, A.
Title: Reliability Improvement of High-Power THz GaN Gunn Sources for Active Imaging Systems
Language: English
Uncontrolled Keywords: gallium compounds;Gunn diodes;heat sinks;III-V semiconductors;terahertz wave imaging;wide band gap semiconductors;higher output power;high diode current;field plate technology;heat sink;THz Gunn source;active imaging systems;reliability improvement;voltage 32.0 V;current 1.5 A;GaN;Gallium nitride;Power generation;Substrates;Reliability;Imaging;Heat sinks;Terahertz radiation
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics > Photonics and Optical Communications
18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics
Event Title: 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)
Date Deposited: 21 May 2019 11:13
DOI: 10.1109/IRMMW-THz.2018.8510363
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