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Characterization and Modeling of Epitaxially Grown BST on a Conducting Oxide Electrode

Walk, D. ; Salg, P. ; Kienemund, D. ; Radetinac, A. ; Zeinar, L. ; Schuster, C. ; Komissinskiy, P. ; Alff, L. ; Jakoby, R. ; Maune, H. (2018):
Characterization and Modeling of Epitaxially Grown BST on a Conducting Oxide Electrode.
pp. 563-566, 2018 48th European Microwave Conference (EuMC), DOI: 10.23919/EuMC.2018.8541771,
[Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2018
Creators: Walk, D. ; Salg, P. ; Kienemund, D. ; Radetinac, A. ; Zeinar, L. ; Schuster, C. ; Komissinskiy, P. ; Alff, L. ; Jakoby, R. ; Maune, H.
Title: Characterization and Modeling of Epitaxially Grown BST on a Conducting Oxide Electrode
Language: German
Uncontrolled Keywords: barium compounds;capacitance;dielectric thin films;epitaxial growth;epitaxial layers;leakage currents;paramagnetic resonance;permittivity;strontium compounds;varactors;Q factor;effective capacitance;leakage current;epitaxial growth;EM-model;conducting oxide;thin film BST50 varactor growth;ESR;permittivity;frequency 1.0 GHz;Ba0.5Sr0.5TiO3;Q-factor;Electrodes;Varactors;Capacitance;Q measurement;Permittivity measurement;Frequency measurement
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics > Microwave Engineering
18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics
Event Title: 2018 48th European Microwave Conference (EuMC)
Date Deposited: 06 Feb 2019 10:58
DOI: 10.23919/EuMC.2018.8541771
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