TU Darmstadt / ULB / TUbiblio

Stress evolution and cracking of crystalline diamond thin films on ductile titanium substrate: Analysis by micro-Raman spectroscopy and analytical modelling

Ahmed, F. and Bayerlein, K. and Rosiwal, S.M. and Göken, M. and Durst, Karsten (2011):
Stress evolution and cracking of crystalline diamond thin films on ductile titanium substrate: Analysis by micro-Raman spectroscopy and analytical modelling.
In: Acta Materialia, pp. 5422-5433, 59, (14), ISSN 1359-6454, DOI: 10.1016/j.actamat.2011.05.015, [Article]

Item Type: Article
Erschienen: 2011
Creators: Ahmed, F. and Bayerlein, K. and Rosiwal, S.M. and Göken, M. and Durst, Karsten
Title: Stress evolution and cracking of crystalline diamond thin films on ductile titanium substrate: Analysis by micro-Raman spectroscopy and analytical modelling
Language: English
Journal or Publication Title: Acta Materialia
Volume: 59
Number: 14
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Physical Metallurgy
Date Deposited: 19 Jul 2018 11:46
DOI: 10.1016/j.actamat.2011.05.015
Export:

Optionen (nur für Redakteure)

View Item View Item