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Stress evolution and cracking of crystalline diamond thin films on ductile titanium substrate: Analysis by micro-Raman spectroscopy and analytical modelling

Ahmed, F. and Bayerlein, K. and Rosiwal, S.M. and Göken, M. and Durst, Karsten (2011):
Stress evolution and cracking of crystalline diamond thin films on ductile titanium substrate: Analysis by micro-Raman spectroscopy and analytical modelling.
In: Acta Materialia, 59 (14), pp. 5422-5433, ISSN 1359-6454,
DOI: 10.1016/j.actamat.2011.05.015,
[Article]

Item Type: Article
Erschienen: 2011
Creators: Ahmed, F. and Bayerlein, K. and Rosiwal, S.M. and Göken, M. and Durst, Karsten
Title: Stress evolution and cracking of crystalline diamond thin films on ductile titanium substrate: Analysis by micro-Raman spectroscopy and analytical modelling
Language: English
Journal or Publication Title: Acta Materialia
Volume: 59
Number: 14
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Physical Metallurgy
Date Deposited: 19 Jul 2018 11:46
DOI: 10.1016/j.actamat.2011.05.015
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